Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Measurement substrate, a measurement method and a measurement system

Measurement substrate, a measurement method and a measurement system

US Patent 10451981 · Granted Oct 22, 2019

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Valved vascular prosthesis and manufacturing method thereof2025
Dynamically determining origin and destination locations for a network system2025
Clamp assembly2025
Method, apparatus, device and storage medium for training model2024
Dynamically determining origin and destination locations for a network system2024
Method for analyzing stability of permanent magnet synchronous generator-based w2024
Method for extracting kansei adjective of product based on principal component a2024
Method and apparatus for processing information2023
Preset three-stage adjustable downhole choke with choking and pressure measureme2023
Method and apparatus for processing sematic description of text entity, and stor2023
Hybrid conversations with human and virtual assistants2023
Fluid handling structure and lithographic apparatus2023