Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method of analyzing lattice strain of semiconductor device

Method of analyzing lattice strain of semiconductor device

US Patent 10410332 · Granted Sep 10, 2019

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Secondary battery having multilayer battery case and method of manufacturing the2023
Panel inspecting apparatus and method2017
Optical module for surface inspection and surface inspection apparatus including2016
Electro-optic modulator including composite materials and testing apparatus incl2016
Terminal device and method for transceiving data thereof2016
Position detector and autofocus control apparatus using focal point deviation de2015
Auto focusing devices for optical microscopes2014
Terminal device and method for transceiving data thereof2014
Fuse box, method of forming a fuse box, and fuse cutting method2009
Integrated circuit devices having corrosion resistant fuse regions and methods o2007