Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10410332 | Method of analyzing lattice strain of semiconductor device | Myoung-ki Ahn, Gwang-Seon Byun, Han Saem PARK, Hyun-koo Kwak, Ung-Keun Cho | 2019-09-10 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10410332 | Method of analyzing lattice strain of semiconductor device | Myoung-ki Ahn, Gwang-Seon Byun, Han Saem PARK, Hyun-koo Kwak, Ung-Keun Cho | 2019-09-10 |