Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Studying dynamic specimen behavior in a charged-particle microscope

Studying dynamic specimen behavior in a charged-particle microscope

US Patent 10340113 · Granted Jul 2, 2019

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Charged particle beam device for inspection of a specimen with a plurality of ch2024
Time-gated detection, dual-layer SPAD-based electron detection2023
Coating on dielectric insert of a resonant RF cavity2022
Slice depth reconstruction of charged particle images using model simulation for2022
System and method for RF pulsed electron beam based STEM2021
X-ray imaging system for a catheter2021
Pulsed CFE electron source with fast blanker for ultrafast TEM applications2021
Multi-electron-beam imaging apparatus with improved performance2021
Studying dynamic specimens in a transmission charged particle microscope2020
ROI painting2018
Time-resolved charged particle microscopy2018
Time-of-flight charged particle spectroscopy2018