Assignee
- Mettler-Toledo (Changzhou) Precision Instruments
- Mettler-Toledo (Changzhou) Measurement Technology
- Metter Toledo (Changzhou) Scale & System
Inventors
- Feng Dai (18 patents)
- Daniel Reber (16 patents)
- Jean-Christophe Emery (21 patents)
US Patent 10215617 · Granted Feb 26, 2019