Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Automatic delay-line calibration using a replica array

Automatic delay-line calibration using a replica array

US Patent 10199082 · Granted Feb 5, 2019

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Dual-ported read SRAM cell with improved soft error immunity2005
Edge feed ink delivery thermal inkjet printhead structure and method of fabricat1997
Thermal inkjet printhead structure and method for making the same1992
Control valve utilizing mechanical beam buckling1991