Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Measurement technique for thin-film characterization

Measurement technique for thin-film characterization

US Patent 10175180 · Granted Jan 8, 2019

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Display component, display screen, and electronic device2024
Decorative surface finish and method of forming same2014
Multiple SQUID magnetometer2011
Process for preparing chrome surface for coating2009
Platable coating and plating process2008
Nuclear magnetic resonance level gauging device2000
Method of and apparatus for determining a response characteristic1999
Method and apparatus for compacting integrataed circuits with transistor sizing1997
Automatic DCS routing for multilayer packages to minimize coupled noise1996
Cryogenic nuclear gyroscope1980