Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Electronical device for measuring at least one electrical characteristic of an object

Electronical device for measuring at least one electrical characteristic of an object

US Patent 10107772 · Granted Oct 23, 2018

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Semiconductor structure comprising a buried porous layer for RF applications2024
RF substrate structure and method of production2023
Support for a semiconductor structure2022
Device for connecting at least one nano-object associated with a chip enabling a2020
Device for connecting at least one nano-object associated with a chip enabling a2020
Device for connecting at least one nano-object and method of manufacturing it2019
Device for connecting at least one nano-object and method of manufacturing it2019
Method of testing a semiconductor-on-insulator structure and application of said2017
Method for fabricating a structure2017
Bolometric detector with a compensation bolometer having an enhanced thermalizat2016
Method for manufacturing a semiconductor on insulator structure having low elect2016
Method for measuring defects in a silicon substrate by applying a heat treatment2016