Low granularity coarse depth test efficiency enhancement

Assignee

• Intel

Inventors

• Vasanth Ranganathan (158 patents)
• Saikat Mandal (19 patents)
• Karol A. Szerszen (26 patents)
• Saurabh Sharma (45 patents)
• Vamsee Vardhan Chivukula (10 patents)
• Abhishek R. Appu (505 patents)
• Joydeep Ray (501 patents)
• Prasoonkumar Surti (269 patents)
• Altug Koker (492 patents)

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