Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12399195 | Method for measuring, by measurement device, characteristics of surface of object to be measured, atomic force microscope for performing same method, and computer program stored in storage medium to perform same method | Ahjin JO, Seung Hun BAIK, Seonghun Yun, Sang-Il Park | 2025-08-26 |
| 12038455 | Measuring method for measuring heat distribution of specific space using SThM probe, method and device for detecting beam spot of light source | Sang-Il Park, Ahjin JO, Soobong Choi | 2024-07-16 |
| 11619649 | Atomic force microscope equipped with optical measurement device and method of acquiring information on surface of measurement target using the same | Sang-Il Park, Seung Ho HAN, Sang J. Cho | 2023-04-04 |
| 11598788 | Measuring method for measuring heat distribution of specific space using SThM probe, method and device for detecting beam spot of light source | Sang-Il Park, Ahjin JO, Soobong Choi | 2023-03-07 |
| 9645168 | Head limiting movement range of laser spot and atomic force microscope having the same | Sang-Il Park, Dongryul Kim, Sang Han Chung | 2017-05-09 |
| 8209766 | Scanning probe microscope capable of measuring samples having overhang structure | Sang-Il Park, Sang Han Chung | 2012-06-26 |