Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9632141 | Simultaneous transition testing of different clock domains in a digital integrated circuit | Ali Vahidsafa | 2017-04-25 |
| 7523297 | Shadow scan decoder | — | 2009-04-21 |
| 7313745 | Decoder for pin-based scan test | — | 2007-12-25 |