MC

Morgan A. Crouch

OI Onto Innovation: 2 patents #15 of 69Top 25%
NI Nanometrics Incorporated: 1 patents #69 of 127Top 55%
🗺 California: #149,087 of 386,348 inventorsTop 40%
Overall (All Time): #1,410,951 of 4,157,543Top 35%
3
Patents All Time

Issued Patents All Time

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
11280381 Active damper for semiconductor metrology and inspection systems Paul Doyle, Mark James Franceschi, Kenneth E. James 2022-03-22
10784136 FOUP purge shield Paul Doyle 2020-09-22
10451542 Local purge within metrology and inspection systems Paul Doyle, Ryan Tsai 2019-10-22