RT

Ryan Tsai

NI Nanometrics Incorporated: 1 patents #69 of 127Top 55%
Overall (All Time): #4,144,112 of 4,157,543Top 100%
1
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
10451542 Local purge within metrology and inspection systems Paul Doyle, Morgan A. Crouch 2019-10-22