Issued Patents All Time
Showing 25 most recent of 98 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12217411 | Inspection apparatus, unit selection apparatus, inspection method, and computer-readable storage medium storing an inspection program | Masashi Kurita, Sakon Yamamoto, Yuki Hasegawa, Yuki Hanzawa, Shigenori NAGAE | 2025-02-04 |
| 12171231 | Oxadiazole compounds or salts thereof, agrohorticultural fungicides containing the compounds, and methods of using the same | Naoya Fujita | 2024-12-24 |
| 11881514 | Semiconductor device and termination structure | Shigeo Tokumitsu, Masaki Shiraishi, Tetsuo Oda | 2024-01-23 |
| 11750902 | Image sensor | Kosuke Watanabe, Yasuhito Uetsuji | 2023-09-05 |
| 11619591 | Image inspection apparatus and image inspection method | Shingo Inazumi | 2023-04-04 |
| 11567013 | Image inspection device and lighting device | Shingo Inazumi | 2023-01-31 |
| 11536667 | Image inspection apparatus and image inspection method | Shingo Inazumi | 2022-12-27 |
| 11368603 | Image processing for converting multi-spectral image by calculating the inner product of the spectral distribution of each pixel and the respective reference vector | — | 2022-06-21 |
| 11324219 | Amide compound or salt thereof, agricultural and horticultural microbicide comprising the compound and the salt, and method for using the agricultural and horticultural microbicide | Keiichi Yamada, Yutaka Abe, Ayuko Nakauchi, Yuki Saito, Shunsuke Fuchi | 2022-05-10 |
| 11303821 | Illumination device, illumination unit, and image processing system | Shingo Inazumi, Jaewook HWANG | 2022-04-12 |
| 11245842 | Appearance inspection system, setting device, image processing device, inspection method, and program | — | 2022-02-08 |
| 11218642 | Appearance inspection system, setting device, and inspection method | — | 2022-01-04 |
| 11084153 | Stapler | Hiroaki Takahashi | 2021-08-10 |
| 11080843 | Image inspecting apparatus, image inspecting method and image inspecting program | Shingo Inazumi | 2021-08-03 |
| 11080836 | Appearance inspection system, image processing device, imaging device, and inspection method | Yasuhito Uetsuji | 2021-08-03 |
| 11022560 | Image inspection device | — | 2021-06-01 |
| 10984515 | Image inspection device and illumination device | — | 2021-04-20 |
| 10984516 | Image inspection device and illumination device | — | 2021-04-20 |
| 10939024 | Image processing system, image processing device and image processing program for image measurement | — | 2021-03-02 |
| 10909672 | Appearance inspection system, image processing device, setting device, and inspection method | Shingo Inazumi, Naoya Nakashita | 2021-02-02 |
| 10896499 | Image processing system, image processing device and image processing program | — | 2021-01-19 |
| 10887506 | Image inspection device, image inspection method and computer readable recording medium | — | 2021-01-05 |
| 10867225 | Measurement system and measurement method | Toyoo Iida, Hitoshi Nakatsuka | 2020-12-15 |
| 10859506 | Image processing system for processing image data generated in different light emission states, non-transitory computer readable recording medium, and image processing method | — | 2020-12-08 |
| 10863069 | Image processing system and setting method | Jaewook HWANG, Shingo Inazumi | 2020-12-08 |