Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12217411 | Inspection apparatus, unit selection apparatus, inspection method, and computer-readable storage medium storing an inspection program | Sakon Yamamoto, Yuki Hasegawa, Yuki Hanzawa, Shigenori NAGAE, Yutaka Kato | 2025-02-04 |
| 11830174 | Defect inspecting device, defect inspecting method, and storage medium | Yasuyuki Ikeda | 2023-11-28 |
| 11769248 | Image processing device, image processing method, and image processing non-transitory computer readable medium for verifying detectable range of defect image | Yasuyuki Ikeda, Sakon Yamamoto | 2023-09-26 |
| 11631230 | Method, device, system and computer-program product for setting lighting condition and storage medium | Yosuke Naruse | 2023-04-18 |
| 11574397 | Image processing device, image processing method, and computer readable recording medium | Yasuyuki Ikeda | 2023-02-07 |
| 11461996 | Method, apparatus and system for determining feature data of image data, and storage medium | — | 2022-10-04 |
| 11301978 | Defect inspection device, defect inspection method, and computer readable recording medium | Yasuyuki Ikeda | 2022-04-12 |
| 11240441 | Method, device, system and computer-program product for setting lighting condition and storage medium | Yosuke Naruse | 2022-02-01 |
| 11176650 | Data generation apparatus, data generation method, and data generation program | Yuki Hanzawa | 2021-11-16 |
| 10885618 | Inspection apparatus, data generation apparatus, data generation method, and data generation program | Yuki Hanzawa | 2021-01-05 |
| 10878283 | Data generation apparatus, data generation method, and data generation program | Yuki Hanzawa | 2020-12-29 |
| 10776909 | Defect inspection apparatus, defect inspection method, and non-transitory computer readable medium | Yasuyuki Ikeda | 2020-09-15 |
| 9189694 | Image processing device and image processing method | Norikazu Tonogai, Tadashi HYUGA, Yoshihisa Minato, Masamichi Oe | 2015-11-17 |