Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8894899 | Method of producing friction material | Masaaki Kobayashi, Naoki Odani, Shusuke Suzuki | 2014-11-25 |
| 7308329 | Method and apparatus for inspecting semiconductor wafer | Yasunori Ikeno, Shunsuke Kurata, Yoshiaki Suge | 2007-12-11 |
| 7102743 | Semiconductor wafer inspection apparatus | Haruyuki Tsuji, Katsuyuki Hashimoto, Yasunori Ikeno, Shunsuke Kurata, Masahiko Yazawa | 2006-09-05 |