Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10175041 | Measuring head and eccentricity measuring device including the same | Kanato Adachi | 2019-01-08 |
| 7817335 | Microscope apparatus | Go Ryu, Masato Yabe, Norio Maruyama, Daisuke Yokoi | 2010-10-19 |
| 7764424 | Light source apparatus and microscope apparatus | Masato Yabe, Daisuke Yokoi, Norio Maruyama, Yukio Eda | 2010-07-27 |
| 7747101 | Lens evaluation device | Toshiaki Matsuzawa, Go Ryu, Yukio Eda | 2010-06-29 |
| 6707546 | Apparatus for inspecting a substrate | Hiroyuki Okahira, Yuzo Nakamura, Nobuo Fujisaki | 2004-03-16 |
| 6671041 | Apparatus for inspecting a substrate | Hiroyuki Okahira, Yuzo Nakamura, Nobuo Fujisaki | 2003-12-30 |
| 6580518 | Confocal microscope and height measurement method using the same | Yukio Eda, Nahoko Hisata, Yasuhiro Kamihara | 2003-06-17 |
| 6362884 | Apparatus for inspecting a substrate | Hiroyuki Okahira, Yuzo Nakamura, Nobuo Fujisaki | 2002-03-26 |
| 4971445 | Fine surface profile measuring apparatus | Eiichi Sato, Kiyozo Koshiishi, Sadao Shigetomi, Syunpei Tanaka, Makoto Yoshinaga +6 more | 1990-11-20 |
| 4832474 | Microscope apparatus for examining wafer | Makoto Yoshinaga, Yoichi Iba, Noriyuki Miyahara, Masami Kawasaki, Takashi Nagano | 1989-05-23 |
| 4744642 | Microscope | Makoto Yoshinaga, Yoichi Iba, Noriyuki Miyahara, Masami Kawasaki, Takashi Nagano | 1988-05-17 |
| 4732485 | Optical surface profile measuring device | Noriyuki Miyahara, Hisao Kitagawa | 1988-03-22 |
| 4611221 | Solid state image pick-up device | Masaharu Imai, Ikuo Tohukuji, Osamu Onitsuka, Shunpei Tanaka, Hiroshi Matsui | 1986-09-09 |