Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4832474 | Microscope apparatus for examining wafer | Makoto Yoshinaga, Yoichi Iba, Masami Kawasaki, Terumasa Morita, Takashi Nagano | 1989-05-23 |
| 4769530 | Focusing degree-detecting device with a reduction optical system | — | 1988-09-06 |
| 4744642 | Microscope | Makoto Yoshinaga, Yoichi Iba, Masami Kawasaki, Terumasa Morita, Takashi Nagano | 1988-05-17 |
| 4734570 | Active focus detecting device with infrared source | Yoshiaki Horikawa, Kazuo Kajitani | 1988-03-29 |
| 4732485 | Optical surface profile measuring device | Terumasa Morita, Hisao Kitagawa | 1988-03-22 |