Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7081758 | Inspection pattern, inspection method, and inspection system for detection of latent defect of multi-layer wiring structure | Eiichi Umemura, Hiroyuki Fukunaga | 2006-07-25 |
| 6884637 | Inspection pattern, inspection method, and inspection system for detection of latent defect of multi-layer wiring structure | Eiichi Umemura, Hiroyuki Fukunaga | 2005-04-26 |