Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7215029 | Multilayer interconnection structure of a semiconductor | — | 2007-05-08 |
| 7081758 | Inspection pattern, inspection method, and inspection system for detection of latent defect of multi-layer wiring structure | Hiroyuki Fukunaga, Hiroyuki Nakayashiki | 2006-07-25 |
| 6884637 | Inspection pattern, inspection method, and inspection system for detection of latent defect of multi-layer wiring structure | Hiroyuki Fukunaga, Hiroyuki Nakayashiki | 2005-04-26 |
| 6787705 | Interconnection structure of semiconductor element | — | 2004-09-07 |
| 6690092 | Multilayer interconnection structure of a semiconductor device | — | 2004-02-10 |
| 6677236 | Semiconductor device fabrication method for interconnects that suppresses loss of interconnect metal | — | 2004-01-13 |
| 6444918 | Interconnection structure of semiconductor element | — | 2002-09-03 |
| 6346749 | Semiconductor device | — | 2002-02-12 |