Issued Patents All Time
Showing 1–18 of 18 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7332914 | Conductor inspection apparatus and conductor inspection method | Shuji Yamaoka, Akira Nurioka, Mishio Hayashi | 2008-02-19 |
| 7173445 | Sensor for inspection instrument and inspection instrument | Tatsuhisa Fujii, Kazuhiro Monden, Mikiya Kasai, Shuji Yamaoka | 2007-02-06 |
| 7138805 | Device and method for inspection | Shuji Yamaoka | 2006-11-21 |
| 7088107 | Circuit pattern inspection instrument and pattern inspection method | Shuji Yamaoka, Hiroshi Hamori | 2006-08-08 |
| 7049826 | Inspection device and inspection method | Koji Okano | 2006-05-23 |
| 6995566 | Circuit pattern inspection apparatus, circuit pattern inspection method, and recording medium | Shuji Yamaoka | 2006-02-07 |
| 6992493 | Device and method for substrate displacement detection | Shuji Yamaoka | 2006-01-31 |
| 6972573 | Device and method for inspecting circuit board | Shuji Yamaoka | 2005-12-06 |
| 6958619 | Inspecting apparatus and inspecting method for circuit board | Shuji Yamaoka | 2005-10-25 |
| 6952104 | Inspection method and apparatus for testing fine pitch traces | Shuji Yamaoka | 2005-10-04 |
| 6943559 | Circuit pattern inspection device, circuit pattern inspection method, and recording medium | Shuji Yamaoka | 2005-09-13 |
| 6894515 | Inspection unit and method of manufacturing substrate | Koji Okano | 2005-05-17 |
| 6861863 | Inspection apparatus for conductive patterns of a circuit board, and a holder thereof | Tatuhisa Fujii | 2005-03-01 |
| 6859062 | Apparatus and method for inspecting a board used in a liquid crystal panel | Tatuhisa Fujii | 2005-02-22 |
| 6842026 | Inspecting apparatus and inspecting method for circuit board | Shuji Yamaoka | 2005-01-11 |
| 6734692 | Inspection apparatus and sensor | Tatuhisa Fujii, Shuji Yamaoka | 2004-05-11 |
| 6710607 | Method and apparatus for inspection | Tatuhisa Fujii, Shuji Yamaoka | 2004-03-23 |
| 6703849 | Inspection apparatus, inspection method and inspection unit therefor | Shuji Yamaoka | 2004-03-09 |