Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11567114 | Capacitance detection area sensor and conductive pattern sensing apparatus having capacitance detection area sensor | Shigetoshi Sugawa, Rihito Kuroda, Tetsuya Goto, Shinichi Murakami, Toshiro Yasuda | 2023-01-31 |
| 7088107 | Circuit pattern inspection instrument and pattern inspection method | Shuji Yamaoka, Shogo Ishioka | 2006-08-08 |