Issued Patents All Time
Showing 1–16 of 16 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12400731 | One-time-programmable (OTP) memory with error detection | Jorge Ernesto Perez Chamorro | 2025-08-26 |
| 12287752 | Methods and systems for serial control with interleaved register mapping | — | 2025-04-29 |
| 12189567 | Methods and systems for lightweight multiprotocol gateway and bridge | — | 2025-01-07 |
| 12015439 | Methods and systems for communicating data and control information over a serial link | — | 2024-06-18 |
| 11172456 | Methods and systems for communicating data and control information over a serial link | Yuhang Zhu, John J. Vaglica | 2021-11-09 |
| 11039511 | Defrosting apparatus with two-factor mass estimation and methods of operation thereof | James Eric Scott, Hung Hoa Tran | 2021-06-15 |
| 10318447 | Universal SPI (Serial Peripheral Interface) | Jason R. Fender, Michael L. Fraser | 2019-06-11 |
| 10027284 | Modifiable signal adjustment devices for power amplifiers and corresponding methods and apparatus | Joseph Staudinger, Abdulrhman M. S. Ahmed, Paul R. Hart, Monte G. Miller | 2018-07-17 |
| 9774299 | Modifiable signal adjustment devices for power amplifiers and corresponding methods and apparatus | Joseph Staudinger, Abdulrhman M. S. Ahmed, Paul R. Hart, Monte G. Miller | 2017-09-26 |
| 9658971 | Universal SPI (serial peripheral interface) | Jason R. Fender, Michael L. Fraser | 2017-05-23 |
| 6462789 | Circuit and method for generating chrominance lock | Luciano Zoso | 2002-10-08 |
| 5572482 | Block architected static RAM configurable for different word widths and associated method for forming a physical layout of the static RAM | Gary Hoshizaki, Jerome A. Grula | 1996-11-05 |
| 5425035 | Enhanced data analyzer for use in bist circuitry | Jerome A. Grula, Glen Caby | 1995-06-13 |
| 5383195 | BIST circuit with halt signal | Jerome A. Grula | 1995-01-17 |
| 5258985 | Combinational data generator and analyzer for built-in self test | Glen Caby | 1993-11-02 |
| 5222066 | Modular self-test for embedded SRAMS | Jerome A. Grula, Gary Hoshizaki | 1993-06-22 |