Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8519388 | Embedded structure for passivation integrity testing | Sebastien Jacqueline, Patrice Gamand, Dominique Yon | 2013-08-27 |
| 8395399 | Semiconductor device and wafer with a test structure and method for assessing adhesion of under-bump metallization | Serge Bardy, Philippe Le Duc, David Desmortreux | 2013-03-12 |