JG

Jose De Jesus Pineda De Gyvez

NB Nxp B.V.: 34 patents #20 of 3,591Top 1%
SS St-Ericsson Sa: 2 patents #146 of 771Top 20%
NU Nxp Usa: 1 patents #1,089 of 2,066Top 55%
📍 Eindhoven, CA: #8 of 87 inventorsTop 10%
Overall (All Time): #85,504 of 4,157,543Top 3%
38
Patents All Time

Issued Patents All Time

Showing 26–38 of 38 patents

Patent #TitleCo-InventorsDate
7886259 Method and circuit arrangement for determining power supply noise Josep Rius Vazquez 2011-02-08
7671618 Analog IC having test arrangement and test method for such an IC Amir Zjajo, Hendrik Johannes Bergveld, Rodger Frank Schuttert 2010-03-02
7619431 High sensitivity magnetic built-in current sensor Johannes De Wilde, Franciscus Gerardus Maria De Jong, Josephus Huisken, Hans Marc Bert Boeve, Kim Phan Le 2009-11-17
7577858 Method for reducing power consumption in a state retaining circuit, state retaining circuit and electronic device Manish Garg, Kiran Batni Raghavendra Rao 2009-08-18
7539589 Testing radio frequency and analogue circuits Alexander G. Gronthoud, Rachid Amine 2009-05-26
7500204 Real-time adaptive control for best IC performance Francesco Pessolano, Rinze Ida Mechtildis Peter Meijer, Josep Rius Vazquez, Kiran Batni Raghavendra Rao 2009-03-03
7477110 Method and device for testing a phase locked loop Alexander G. Gronthoud, Cristiano Cenci 2009-01-13
7463508 SRAM test method and SRAM test arrangement to detect weak cells Mohamed Azimane, Andrei Pavlov 2008-12-09
7457971 Monitoring and controlling power consumption in a sequential logic circuit Josep Rius Vazquez 2008-11-25
7336088 Method and apparatus for determining IDDQ Josep Rius Vazquez 2008-02-26
7332953 Circuit and method for controlling the threshold voltage of transistors Massimo A. Leone 2008-02-19
7256645 Suppression of noise in an integrated circuit Rosario Capor 2007-08-14
7200057 Test for weak SRAM cells Manoj Sachdev, Andrei Pavlov 2007-04-03