Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 8145958 | Integrated circuit and method for testing memory on the integrated circuit | Robert Campbell Aitken | 2012-03-27 | $7,434,000 |
| 8112681 | Method and apparatus for handling fuse data for repairing faulty elements within an IC | Faisal Ramzan Ali Khoja, Sauro Landini, Ramamurti Chandramouli | 2012-02-07 | $15,169,000 |
| 8045401 | Supporting scan functions within memories | Yew Keong Chong, Gus Yeung, Paul Darren Hoxey, Paul Stanley Hughes | 2011-10-25 | $12,450,000 |
| 7734974 | Serial scan chain control within an integrated circuit | Robert Campbell Aitken, Dipesh Ishwerbhai Patel | 2010-06-08 | $2,390,000 |