Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12257084 | Motion free CT sampling with electron beam scanning and time delay integration detector | Tiezhi Zhang, Shuang Zhou, Yuewen Tan | 2025-03-25 |
| 8588370 | Article inspection device and inspection method | Yigang Yang, Tiezhu Li, Qinjian Zhang, Yi Zhang, Yingkang Jin +2 more | 2013-11-19 |
| 8406375 | Article inspection device and inspection method | Yigang Yang, Tiezhu Li, Qinjiar Zhang, Yi Zhang, Yingkang Jin +2 more | 2013-03-26 |