Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10950536 | Packed interconnect structure with reduced cross coupled noise | Zhen Zhou, Jun Liao, Xiang Li, Daqiao Du, Tae Young Yang +2 more | 2021-03-16 |
| 5777841 | Method of qualification testing of DC-DC converters | Ken David Ellacott | 1998-07-07 |