Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10948425 | X-ray inspection apparatus for inspecting semiconductor wafers | William T. Walker | 2021-03-16 |
| 10393675 | X-ray inspection apparatus | John Tingay, William T. Walker, Simon White, Kate Donaldson-Stewart | 2019-08-27 |