Eric Maiken

NTN&K Technology: 1 patents #18 of 23Top 80%

California: #247,236 of 386,348 inventorsTop 65%

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1 Patents All Time

Issued Patents All Time

Showing 1–1 of 1 patents

Patent #	Title	Co-Inventors	Date
6594025	Method of monitoring thin-film processes and metrology tool thereof	Abdul Rahim Forouhi, Dale A. Harrison, John Lam	2003-07-15