Issued Patents All Time
Showing 26–34 of 34 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7249295 | Test circuit for semiconductor device | Takeru Yonaga, Hitoshi Tanaka | 2007-07-24 |
| 7220314 | Single crystalline aluminum nitride film, method of forming the same, base substrate for group III element nitride film, light emitting device and surface acoustic wave device | Kazuhiro Nagata, Wataru Nakao | 2007-05-22 |
| 7114113 | Test circuit provided with built-in self test function | Takeru Yonaga, Hitoshi Tanaka | 2006-09-26 |
| 7054403 | Phase-Locked Loop | Hideyuki Nosaka, Hideki Kamitsuna | 2006-05-30 |
| 6826101 | Semiconductor device and method for testing the same | — | 2004-11-30 |
| 6744076 | Single crystalline aluminum nitride film, method of forming the same, base substrate for group III element nitride film, light emitting device and surface acoustic wave device | Kazuhiro Nagata, Wataru Nakao | 2004-06-01 |
| 6510097 | DRAM interface circuit providing continuous access across row boundaries | — | 2003-01-21 |
| 6025740 | Clock feeding circuit and method for adjusting clock skew | — | 2000-02-15 |
| 5270592 | Clock supply circuit layout in a circuit area | Tadao Takahashi, Ichiro Yamamoto | 1993-12-14 |