Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7437645 | Test circuit for semiconductor device | Hiroyuki Fukuyama, Hitoshi Tanaka | 2008-10-14 |
| 7333372 | Reset circuit and integrated circuit device with reset function | Hitoshi Tanaka, Hiroyuki Fukuyama | 2008-02-19 |
| 7249295 | Test circuit for semiconductor device | Hiroyuki Fukuyama, Hitoshi Tanaka | 2007-07-24 |
| 7225379 | Circuit and method for testing semiconductor device | — | 2007-05-29 |
| 7114113 | Test circuit provided with built-in self test function | Hiroyuki Fukuyama, Hitoshi Tanaka | 2006-09-26 |
| 5790470 | Decoder circuit having a predecoder acitivated by a reset signal | — | 1998-08-04 |
| 5444662 | Dynamic random access memory with bit line equalizing means | Takayuki Tanaka, Yoshimasa Sekino, Yoshihiro Murashima, Yasuhiro Tokunaga, Joji Ueno | 1995-08-22 |
| 5420823 | Semiconductor memory with improved power supply control circuit | Jouji Ueno, Junichi Suyama | 1995-05-30 |