Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10234756 | Scanner based optical proximity correction system and method of use | Jacek Tyminski, Tomoyuki Matsuyama | 2019-03-19 |
| 9753363 | Scanner based optical proximity correction system and method of use | Jacek Tyminski, Tomoyuki Matsuyama | 2017-09-05 |
| 9529253 | Predicting pattern critical dimensions in a lithographic exposure process | Jacek Tyminski | 2016-12-27 |
| 9286416 | Scanner based optical proximity correction system and method of use | Jacek Tyminski, Tomoyuki Matsuyama | 2016-03-15 |
| 8572518 | Predicting pattern critical dimensions in a lithographic exposure process | Jacek Tyminski | 2013-10-29 |
| 8365107 | Scanner based optical proximity correction system and method of use | Jacek Tyminski, Tomoyuki Matsuyama | 2013-01-29 |