Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12188977 | Contact probe, probe holder and probe unit | Shuji Takahashi, Kazuya Soma, Takashi Nidaira, Yuya Hironaka | 2025-01-07 |
| 11994535 | Probe unit | Shuji Takahashi | 2024-05-28 |
| 11782074 | Probe unit | Kazuya Soma | 2023-10-10 |
| 11320461 | Probe unit | Kohei Hironaka, Shuji Takahashi | 2022-05-03 |
| 11293946 | Conductive contactor unit | Kohei Hironaka | 2022-04-05 |
| 8456184 | Probe card for a semiconductor wafer | Yoshio Yamada, Hiroshi Nakayama, Mitsuhiro Nagaya, Takashi Akao | 2013-06-04 |
| 8149008 | Probe card electrically connectable with a semiconductor wafer | Yoshio Yamada, Hiroshi Nakayama, Takashi Akao | 2012-04-03 |
| 8049525 | Parallelism adjusting mechanism of probe card | Yoshio Yamada, Hiroshi Nakayama, Mitsuhiro Nagaya, Takashi Akao | 2011-11-01 |
| 7898272 | Probe card | Shunsuke Sasaki, Yoshio Yamada, Mitsuhiro Nagaya, Takashi Akao, Hiroshi Nakayama | 2011-03-01 |