Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11656246 | Contact probe and probe unit | Kazuya Soma | 2023-05-23 |
| 11422156 | Contact probe and probe unit | Kazuya Soma | 2022-08-23 |
| 11320461 | Probe unit | Tsuyoshi Inuma, Shuji Takahashi | 2022-05-03 |
| 11293946 | Conductive contactor unit | Tsuyoshi Inuma | 2022-04-05 |
| 10274517 | Conductive probe for inspection and semiconductor inspection device | Kazuya Souma, Satoshi Shoji, Ryosuke Yamaguchi | 2019-04-30 |
| 10120011 | Test unit | Takashi Nidaira, Tomohiro Yoneda | 2018-11-06 |
| 10082525 | Probe unit | Yoshio Yamada | 2018-09-25 |
| 8633724 | Probe-unit base member and probe unit | Toshio Kazama, Mitsuhiro Kondo, Osamu Ito | 2014-01-21 |
| 8344747 | Probe unit | Toshio Kazama, Shigeki Ishikawa | 2013-01-01 |
| 8096840 | Conductive contact holder and conductive contact unit | Toru Nakamura, Mitsuhiro Kondo | 2012-01-17 |
| 7845955 | Conductive contact holder | Hiroshi Nakayama, Yosuke Mabune | 2010-12-07 |
| 7815438 | Needle-like member, conductive contact, and conductive contact unit | Toshio Kazama | 2010-10-19 |