Issued Patents All Time
Showing 1–16 of 16 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12349461 | Transfer printing for RF applications | Imène Lahbib, Jérôme Loraine, Frédéric Drillet, Albert Kumar | 2025-07-01 |
| 11610916 | Transfer printing for RF applications | Imène Lahbib, Jérôme Loraine, Frédéric Drillet, Albert Kumar | 2023-03-21 |
| 10181429 | Method for the formation of transistors PDSO1 and FDSO1 on a same substrate | Pascal Costaganna, Francis Domart | 2019-01-15 |
| 7580172 | MEMS device and interconnects for same | Alan G. Lewis, Manish Kothari, John Batey, Teruo Sasagawa, Ming-Hau Tung +1 more | 2009-08-25 |
| 7545552 | Sacrificial spacer process and resultant structure for MEMS support structure | — | 2009-06-09 |
| 7423287 | System and method for measuring residual stress | Olivier Pierron | 2008-09-09 |
| 7183627 | Independent control of polycrystalline silicon-germanium in an HBT and related structure | — | 2007-02-27 |
| 7132700 | SiGe layer having small poly grains | Sy Vo | 2006-11-07 |
| 7078744 | Transistor emitter having alternating undoped and doped layers | — | 2006-07-18 |
| 7064073 | Technique for reducing contaminants in fabrication of semiconductor wafers | — | 2006-06-20 |
| 6861308 | Method for fabrication of SiGe layer having small poly grains and related structure | Sy Vo | 2005-03-01 |
| 6797578 | Method for fabrication of emitter of a transistor and related structure | — | 2004-09-28 |
| 6580104 | Elimination of contaminants prior to epitaxy and related structure | — | 2003-06-17 |
| 6559022 | Method for independent control of polycrystalline silicon-germanium in an HBT | — | 2003-05-06 |
| 6514886 | Method for elimination of contaminants prior to epitaxy | — | 2003-02-04 |
| 6365479 | Method for independent control of polycrystalline silicon-germanium in a silicon-germanium HBT and related structure | — | 2002-04-02 |