Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7664307 | Photomask manufacturing support system | — | 2010-02-16 |
| 7577287 | Early error detection during fabrication of reticles | — | 2009-08-18 |
| 7441226 | Method, system, apparatus and program for programming defect data for evaluation of reticle inspection apparatus | — | 2008-10-21 |
| 7275006 | Workpiece inspection apparatus assisting device, workpiece inspection method and computer-readable recording media storing program therefor | Yoshitake Tsuji, Hideo Tsuchiya | 2007-09-25 |
| 7123004 | Method of non-destructive inspection of rear surface flaws and material characteristics using electromagnetic technique and apparatus therefor | Masumi Saka, Hironori Tomyo | 2006-10-17 |