TT

Tohru Tujide

NE Nec: 1 patents #7,889 of 14,502Top 55%
Overall (All Time): #3,750,582 of 4,157,543Top 95%
1
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
5548211 Dynamic fault imaging system using electron beam and method of analyzing fault Toyokazu Nakamura, Kiyoshi Nikawa 1996-08-20