TH

Tadahiko Horiuchi

NE Nec: 12 patents #1,037 of 14,502Top 8%
NS Nscore: 12 patents #1 of 7Top 15%
SC Shin-Etsu Handotai Co.: 1 patents #385 of 679Top 60%
Overall (All Time): #159,828 of 4,157,543Top 4%
25
Patents All Time

Issued Patents All Time

Showing 1–25 of 25 patents

Patent #TitleCo-InventorsDate
12406736 Semiconductor memory device Kazuhiko Oyama 2025-09-02
10727235 Secure fingerprint data generating device 2020-07-28
9966141 Nonvolatile memory cell employing hot carrier effect for data storage 2018-05-08
9893208 Nonvolatile memory device 2018-02-13
9159404 Nonvolatile memory device 2015-10-13
8945293 Silicon oxide removal apparatus and facility for recycling inert gas for use in silicon single crystal manufacturing apparatus Takashi Higuchi 2015-02-03
8451657 Nonvolatile semiconductor memory device using MIS transistor 2013-05-28
7821806 Nonvolatile semiconductor memory circuit utilizing a MIS transistor as a memory cell 2010-10-26
7791927 Mis-transistor-based nonvolatile memory circuit with stable and enhanced performance 2010-09-07
7733714 MIS-transistor-based nonvolatile memory for multilevel data storage Kenji Noda 2010-06-08
7313021 Nonvolatile memory circuit 2007-12-25
7193888 Nonvolatile memory circuit based on change in MIS transistor characteristics 2007-03-20
7149104 Storage and recovery of data based on change in MIS transistor characteristics 2006-12-12
6372628 Insulating film comprising amorphous carbon fluoride, a semiconductor device comprising such an insulating film, and a method for manufacturing the semiconductor device Yoshihisa Matsubara, Ko Noguchi, Shinya Ito, Noriaki Oda, Akira Matsumoto +5 more 2002-04-16
6162710 Method for making MIS transistor Hiroshi Ito 2000-12-19
6147386 Semiconductor device and method of producing the same 2000-11-14
6091081 Insulating film comprising amorphous carbon fluoride, a semiconductor device comprising such an insulating film Yoshihisa Matsubara, Ko Noguchi, Shinya Ito, Noriaki Oda, Akira Matsumoto +5 more 2000-07-18
6001737 Method of forming a semiconductor device having a titanium salicide shallow junction diffusion layer Hiroshi Ito, Naohiko Kimizuka 1999-12-14
5990521 Semiconductor device and method of producing the same 1999-11-23
5712204 Method of making a semiconductor device having reduced junction capacitance between the source and drain regions and the substrate 1998-01-27
5593923 Method of fabricating semiconductor device having refractory metal silicide layer on impurity region using damage implant and single step anneal Takashi Ishigami, Hiroyuki Nakamura, Tohru Mogami, Hitoshi Wakabayashi, Takemitsu Kunio +1 more 1997-01-14
5571745 Fabrication method of semiconductor device containing n- and p-channel MOSFETs 1996-11-05
5543359 Method of forming a titanium silicide film involved in a semiconductor device 1996-08-06
5286664 Method for fabricating the LDD-MOSFET 1994-02-15
5043600 BiCMOS inverter circuit 1991-08-27