Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7795150 | Metal capping of damascene structures to improve reliability using hyper selective chemical-mechanical deposition | Bradley Scott Withers | 2010-09-14 |
| 7344989 | CMP wafer contamination reduced by insitu clean | Bradley Scott Withers | 2008-03-18 |