Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10983478 | Complex defect diffraction model and method for defect inspection of transparent substrate | Chau-Jern Cheng, Kuang-Che Chang Chien, Yu-Chih Lin | 2021-04-20 |
| 10234268 | Method and apparatus for digital holographic microtomography | Chau-Jern Cheng, Yu-Chih Lin | 2019-03-19 |