Issued Patents All Time
Showing 1–7 of 7 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10983478 | Complex defect diffraction model and method for defect inspection of transparent substrate | Han-Yen Tu, Kuang-Che Chang Chien, Yu-Chih Lin | 2021-04-20 |
| 10976152 | Method for defect inspection of transparent substrate by integrating interference and wavefront recording to reconstruct defect complex images information | Chin-Yu Liu, Xin LAI | 2021-04-13 |
| 10613478 | Imaging method of structured illumination digital holography | Xin LAI | 2020-04-07 |
| 10409048 | Method and apparatus for ultrafast time-resolved digital holography | Yu-Chih Lin | 2019-09-10 |
| 10234268 | Method and apparatus for digital holographic microtomography | Yu-Chih Lin, Han-Yen Tu | 2019-03-19 |
| 10042325 | Image processing method | Yu-Chih Lin, Xin LAI | 2018-08-07 |
| 9958262 | System for measuring three-dimensional profile of transparent object or refractive index by fringe projection | Wei-Hung Su, Guang-Hong Chen | 2018-05-01 |