Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7848562 | Method of reducing the time required to perform a passive voltage contrast test | Steven Jacobson, Duc Huu Nguyen, William Ng, Usharani Bhimavarapu, Kevin Weaver | 2010-12-07 |
| 7659742 | Vacuum chamber AC/DC probe | Steven Jacobson, Duc Huu Nguyen | 2010-02-09 |
| 7470553 | Built-in design edit structures | Kevin Weaver | 2008-12-30 |
| 6952106 | E-beam voltage potential circuit performance library | William Ng, Kevin Weaver | 2005-10-04 |
| 6937351 | Non-destructive method of measuring the thickness of a semiconductor wafer | Kevin Weaver, Steven Jacobson | 2005-08-30 |