DN

Dinesh Nair

NI National Instruments: 40 patents #7 of 690Top 2%
AM Amazon: 1 patents #10,608 of 19,158Top 60%
University Of Texas System: 1 patents #2,951 of 6,559Top 45%
TI Texas Instruments: 1 patents #7,357 of 12,488Top 60%
📍 Bengaluru, TX: #3 of 91 inventorsTop 4%
Overall (All Time): #72,913 of 4,157,543Top 2%
42
Patents All Time

Issued Patents All Time

Showing 26–42 of 42 patents

Patent #TitleCo-InventorsDate
6944331 Locating regions in a target image using color matching, luminance pattern matching and hue plane pattern matching Darren R. Schmidt, Kevin L. Schultz, Siming Lin 2005-09-13
6917710 System and method for scanning a region using a low discrepancy curve Ram Rajagopal, Lothar Wenzel 2005-07-12
6909801 System and method for generating a low discrepancy curve on an abstract surface Lothar Wenzel, Ram Rajagopal 2005-06-21
6882958 System and method for curve fitting using randomized techniques Darren R. Schmidt, Ram Rajagopal, Lothar Wenzel 2005-04-19
6820032 System and method for scanning a region using conformal mapping Lothar Wenzel, Ram Rajagopal, Joseph Ting, Sundeep Chandhoke 2004-11-16
6807305 System and method for image pattern matching using a unified signal transform Ram Rajagopal, Lothar Wenzel, Darren R. Schmidt 2004-10-19
6763515 System and method for automatically generating a graphical program to perform an image processing algorithm Nicolas Vazquez, Jeffrey L. Kodosky, Ram Kudukoli, Kevin L. Schultz, Christophe Caltagirone 2004-07-13
6757428 System and method for color characterization with applications in color measurement and color matching Siming Lin 2004-06-29
6681057 Image registration system and method implementing PID control techniques Lothar Wenzel 2004-01-20
6665066 Machine vision system and method for analyzing illumination lines in an image to determine characteristics of an object being inspected Kevin L. Schultz 2003-12-16
6615158 System and method for analyzing a surface by mapping sample points onto the surface and sampling the surface at the mapped points Lothar Wenzel, Ram Rajagopal 2003-09-02
6535640 Signal analysis system and method for determining a closest vector from a vector collection to an input signal Ram Rajagopal, Lothar Wenzel 2003-03-18
6370270 System and method for sampling and/or placing objects using low discrepancy sequences Lothar Wenzel, Nicolas Vazquez, Samson DeKey 2002-04-09
6229921 Pattern matching system and method with improved template image sampling using low discrepancy sequences Lothar Wenzel, Nicolas Vazquez, Samson DeKey 2001-05-08
6222940 Pattern matching system and method which detects rotated and scaled template images Lothar Wenzel, Nicolas Vazquez, Samson DeKey 2001-04-24
6219452 Pattern matching system and method which performs local stability analysis for improved efficiency Lothar Wenzel, Nicolas Vazquez, Samson DeKey 2001-04-17
6049363 Object detection method and system for scene change analysis in TV and IR data Jonathan D. Courtney 2000-04-11