Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7593556 | Sample picture data processing method and sample inspection system and method | Eric Benton, Hitoshi Ishii, Sumiko Takayama, Shinsuke Inagaki, Isao Kobayashi +3 more | 2009-09-22 |
| 6924929 | Microscope apparatus | Yoshihiro Honma | 2005-08-02 |