EB

Eric Benton

NS National Institute Of Radiological Sciences: 1 patents #54 of 121Top 45%
SP Seiko Precision: 1 patents #81 of 173Top 50%
Overall (All Time): #3,336,265 of 4,157,543Top 85%
1
Patents All Time

Issued Patents All Time

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
7593556 Sample picture data processing method and sample inspection system and method Nakahiro Yasuda, Hitoshi Ishii, Sumiko Takayama, Shinsuke Inagaki, Isao Kobayashi +3 more 2009-09-22