YA

Yuting An

NC National Institute Of Metrology, China: 1 patents #31 of 98Top 35%
Overall (All Time): #2,462,164 of 4,157,543Top 60%
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Patent #TitleCo-InventorsDate
12424430 Ion storage system and method based on quadrupole-ion trap tandem mass spectrometry Shiying Chu, You Jiang, Xiang Fang, Zejian Huang, Xinhua Dai +1 more 2025-09-23