XD

Xinhua Dai

NC National Institute Of Metrology, China: 2 patents #18 of 98Top 20%
Overall (All Time): #1,347,889 of 4,157,543Top 35%
3
Patents All Time

Issued Patents All Time

Showing 1–3 of 3 patents

Patent #TitleCo-InventorsDate
12424430 Ion storage system and method based on quadrupole-ion trap tandem mass spectrometry Shiying Chu, You Jiang, Xiang Fang, Zejian Huang, Yuting An +1 more 2025-09-23
11761887 Apparatus and method for quantitative detection of gases Zejian Huang, Xiang Fang, You Jiang 2023-09-19
9745114 Medicine bottle with solid silica flaky drying agent 2017-08-29