YS

Yushu Shi

NC National Institute Of Metrology, China: 2 patents #18 of 98Top 20%
Overall (All Time): #1,791,366 of 4,157,543Top 45%
2
Patents All Time

Issued Patents All Time

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
12174017 Composite measurement system for measuring nanometer displacement Shu Zhang, Fang Wang, Lei Pi, Xiangpeng Bu 2024-12-24
11709045 Surface texture probe and measurement apparatus with a vibrational membrane Shu Zhang, Zhoumiao Shi 2023-07-25