XB

Xiangpeng Bu

NC National Institute Of Metrology, China: 1 patents #31 of 98Top 35%
Overall (All Time): #2,555,129 of 4,157,543Top 65%
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Patent #TitleCo-InventorsDate
12174017 Composite measurement system for measuring nanometer displacement Yushu Shi, Shu Zhang, Fang Wang, Lei Pi 2024-12-24